Zeiss Ultra plus
A state-of-the-art Scanning Electron Microscope (SEM) that offers ultra-high resolution imaging capabilities. Equipped with a suite of imaging detectors including SE2, InLens, ESB, and AsB, it provides a comprehensive range of imaging modes for versatile sample examination.
Furthermore, the microscope is outfitted with advanced microanalytical detectors from Oxford Instruments, namely EDS, EBSD, and WDS. These detectors enable complex characterization of nanomaterials and structures, providing detailed insights into their composition and crystallography.